RF Device Characterisation Seminar Düsseldorf 2025

This seminar provides an in-depth overview of RF device characterisation techniques essential for evaluating the performance of components such as amplifiers, mixers, and filters. Participants will learn how to accurately measure key parameters like gain, noise figure, EVM, and phase noise using advanced tools and methods. The session also covers practical calibration strategies and introduces Keysight’s unique solutions for precise and repeatable measurements in both R&D and production environments.